Standard Number | IEC TS 62607-6-11:2022 |
---|---|
Organization | International Electrotechnical Commission |
Level | International |
Category | Test Method | Characterization | Measurement |
Status |
|
IEC TS 62607-6-11:2022(EN) establishes a standardized method to determine the key control characteristic
• defect density nD
of graphene films grown by chemical vapour deposition as well as exfoliated graphene flakes by
• Raman spectroscopy