IEC TS 62607-6-27 Nanomanufacturing – Key control characteristics – Part 06-27: Two-dimensional materials – Field-effect mobility: 4- terminal measurement

IEC TS 62607-6-27 Nanomanufacturing – Key control characteristics – Part 06-27: Two-dimensional materials – Field-effect mobility: 4- terminal measurement

Standard Number IEC TS 62607-6-27
Organization International Electrotechnical Commission World
Level International
Category Test Method | Characterization | Measurement
Status
  • DEC 2020 Under Development
ABSTRACT
This part of IEC 62607 establishes a standardized method to determine the key control characteristic field-effect mobility for semiconducting two-dimensional (2D) materials. For semiconducting two-dimensional materials, the field-effect mobility is evaluated testing a field-effect transistor with 4-point probe (4PP) configuration by a measurement of the conductivity obtained from transfer curve. The measurement results should help to qualify technologies if they are usable for future electrical subassemblies or electronic device applications. – It is the intent of this standard to be compatible with and work in conjunction with the performance standards defined in the IEC 62607 series.