This part of IEC 62607 establishes a standardized method to determine the key control characteristic field-effect mobility for semiconducting two-dimensional (2D) materials. For semiconducting two-dimensional materials, the field-effect mobility is evaluated testing a field-effect transistor with 4-point probe (4PP) configuration by a measurement of the conductivity obtained from transfer curve. The measurement results should help to qualify technologies if they are usable for future electrical subassemblies or electronic device applications. – It is the intent of this standard to be compatible with and work in conjunction with the performance standards defined in the IEC 62607 series.
