IEC TS 62607-8-4 Nanomanufacturing - Key Control Characteristics - Part 8-4: Nano-enabled metal-oxide interfacial devices - Test method for electronic trap states by low-frequency-noise spectroscopy

IEC TS 62607-8-4 Nanomanufacturing - Key Control Characteristics - Part 8-4: Nano-enabled metal-oxide interfacial devices - Test method for electronic trap states by low-frequency-noise spectroscopy

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Standard Number IEC TS 62607-8-4
Organization International Electrotechnical Commission World
Level International
Category Test Method | Characterization | Measurement
Status
  • DEC 2020 Under Development
ABSTRACT
This part of IEC 62607 focuses on a measurement protocol to evaluate the electronic trap states by low-frequency-noise spectroscopy in nano-enabled metal-oxide interfacial devices. This part of IEC 62607 includes: – outlines of the experimental procedures used to measure resistance change, – methods to evaluate the activation energy of the electronic trap states