Nanomanufacturing - Key control characteristics - Part 12-01: 2D material-related products - Density of interface traps: I-V curve analysis of field effect transistors

Nanomanufacturing - Key control characteristics - Part 12-01: 2D material-related products - Density of interface traps: I-V curve analysis of field effect transistors

Standard Number IEC TS 62607-12-01
Organization International Electrotechnical Commission World
Level International
Category Test Method | Characterization | Measurement
Status
  • NOV 2025 Under Development