Nanomanufacturing - Key control characteristics - Part 12-01: 2D material-related products - Density of interface trapped charges: I-V curve analysis of field effect transistors

Nanomanufacturing - Key control characteristics - Part 12-01: 2D material-related products - Density of interface trapped charges: I-V curve analysis of field effect transistors

Standard Number PNW TS 113-915
Organization International Electrotechnical Commission World
Level International
Category Test Method | Characterization | Measurement
Status
  • AUG 2025 Under Development