IEC TS 62607-x-y: Nanomanufacturing - Key control characteristics - Part X-X: Graphene-related products - Twist angle in bilayer graphene: Raman spectroscopy

Standard Number	PWI 113-176
Organization	International Electrotechnical Commission
Level	International
Category	Test Method \| Characterization \| Measurement
Status	DEC 2025 Under Drafting

ABSTRACT

This part of 62607 establishes a standardized method to determine the structural key control characteristic

• twist angle for bilayer graphene systems like naturally stacked and artificially twisted bilayer graphene by

• Raman spectroscopy method