IEC TS 62607-6-xx: Nanomanufacturing - Key control characteristics - Part 6-X: Graphene-related products - Stacking order of graphene flakes: Raman spectroscopy

This part of IEC 62607-6 establishes a standardized method to determine the key control characteristics stacking order of graphene flakes · stacking order and twist angle of multilayer graphene flakes, derived from defined Raman spectral parameters and reproducible evaluation criteria. These key control characteristics are obtained from measured Raman features and their interpretation according to established stacking-dependent signatures. of graphene flakes for process control, quality assessment, and use in electronic and optoelectronic applications by · Raman spectroscopy.