IEC TS 62607-X-X, Nanomanufacturing – Key control characteristics – Part X-X: Thermal control interfacial devices – Thermal conductivity: Frequency-Domain Thermoreflectance techniques

IEC TS 62607-X-X, Nanomanufacturing – Key control characteristics – Part X-X: Thermal control interfacial devices – Thermal conductivity: Frequency-Domain Thermoreflectance techniques

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Standard Number PWI 113-182
Organization International Electrotechnical Commission World
Level International
Category Specification
Status
  • DEC 2025 Under Drafting
ABSTRACT

This part of IEC TS 62607 specifies a measurement protocol to determine the key control characteristic – Thermal conductivity for thermal control interfacial devices by – Frequency-Domain Thermoreflectance Techniques (FDTR).