| Standard Number | PWI 113-188 |
|---|---|
| Organization |
International Electrotechnical Commission
|
| Level | International |
| Category | Specification |
| Status |
|
This part of IEC TS 62565 establishes a standardized method to determine a blank detail specification (BDS) for quantum dot photoresist. This document is intended to be used for nano-enabled photoelectric display. The relevant key control characteristics (KCC) of quantum dot photoresist are listed, including physical, mechanical and optical properties, and stability. For each KCC, measurement methods and existing standards are reported. Numeric values for the KCCs are left blank as they will be specified between customer and supplier in the detail specification (DS).
