IEEE Standard for Test Methods for the Characterization of Organic Transistors and Materials

IEEE Standard for Test Methods for the Characterization of Organic Transistors and Materials

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Standard Number IEEE 1620-2008
Organization IEEE Standards Association World
Level International
Category Test Method | Characterization | Measurement
Status
  • DEC 2008 Published
  • JAN 2019 Withdrawn
ABSTRACT
This standard describes a method for characterizing organic electronic devices, including measurement techniques, methods of reporting data, and the testing conditions during characterization. Adopted by IEC as IEC 62860 Edition 1.0 2013-07.