Standard Number | ISO/TS 10867:2010 |
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Organization | International Organization for Standardization |
Level | International |
Category | Guide | Practice |
Status |
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ISO/TS 10867:2010 provides guidelines for the characterization of single-wall carbon nanotubes (SWCNTs) using near infrared (NIR) photoluminescence (PL) spectroscopy.ISO/TS 10867:2010 provides a measurement method for the determination of the chiral indices of the semi-conducting SWCNT in a sample and their relative integrated PL intensities.The method can be expanded to estimate relative mass concentrations of semi-conducting SWCNTs in a sample from measured integrated PL intensities and knowledge of their PL cross-sections.