Scanning probe microscope－Method for lateral force microscope

Scanning probe microscope－Method for lateral force microscope

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Standard Number KS D 2714:2006
Organization Korean Agency for Technology and Standards South Korea
Level National
Category Specification
Status
  • DEC 2006 Published
  • OCT 2011 Reviewed and Confirmed
  • DEC 2016 Revised
  • MAY 2021 Reviewed and Confirmed
ABSTRACT

This standard specifies a method for measuring the lateral transverse lateral force using the transverse lateral force microscope function of a scanning probe microscope. This method specifies the horizontal lateral force measurement in a scanning probe microscope.