Nanomanufacturing — Key controlling properties — Part 6-14: Graphene-based materials — Defect levels: Raman spectroscopy

IEC 62607 presents a standard method for determining the following key control characteristics: Determination of the level of defects in powders composed of graphene-based materials using Raman spectroscopy In this standard, the level of defects is measured by the intensity ratio of the D+D' band and the 2D band of the Raman spectrum (ID+D'/I2D). The defect level measured according to this standard is presented as one of the main control characteristic standard items in the blank detail specification IEC 62565-03-01 for powdered graphene. This standard measurement method can be applied to graphene powder or graphene-based materials such as graphene oxide (rGO), double-layer graphene, triple-layer graphene, and multilayer graphene. This standard measurement method can be applied to quality control and classification by graphene manufacturers and product selection for downstream users. This standard measurement method is suitable when the physical form of graphene is powder.