Nanofabrication — Key Control Characteristics — Part 5-3: Thin-Film Organic/Nanoelectronic Devices — Charge Carrier Concentration Measurements

Nanofabrication — Key Control Characteristics — Part 5-3: Thin-Film Organic/Nanoelectronic Devices — Charge Carrier Concentration Measurements

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Standard Number KS C IEC TS 62607-5-3: 2025
Organization Korean Agency for Technology and Standards South Korea
Level National
Category Test Method | Characterization | Measurement
Status
  • AUG 2025 Published
ABSTRACT

This standard applies to sample structures for evaluating a wide range of charge carrier concentrations in organic and nanomaterials. It also applies to both capacitance-voltage (CV) measurements in metal/insulator/semiconductor stacked structures and Hall effect measurements in van der Pauw configurations. This standard also presents criteria for selecting methods for measuring charge carrier concentrations in organic semiconductor layers.