Nanofabrication—Key Control Characteristics—Part 6-2: Graphene—Layer Count: Atomic Force Microscopy, Optical Transmission, and Raman Spectroscopy

Nanofabrication—Key Control Characteristics—Part 6-2: Graphene—Layer Count: Atomic Force Microscopy, Optical Transmission, and Raman Spectroscopy

launch Link To Webstore
Standard Number KS C IEC TS 62607-6-2: 2025
Organization Korean Agency for Technology and Standards South Korea
Level National
Category Test Method | Characterization | Measurement
Status
  • AUG 2025 Published
ABSTRACT

This standard provides standardized methods for measuring the following key control characteristics:

— A combination of the following methods for layer-count graphene flakes:

— Atomic force microscopy;

— Optical transmission microscopy;

— Raman spectroscopy