Standard Number | GB/T 20724-2006 |
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Organization |
Standardization Administration of China
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Level | National |
Category | Test Method | Characterization | Measurement |
Status |
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This standard specifies the determination by transmission electron microscopy thin crystal thickness convergent beam electron diffraction method. This method is applicable to the measurement line indicates the 10 ^ ^ 9m ~ 0. 1 � 10 ^ ^ 3m, the thickness of the range of tens to hundreds of nanometers thickness of the thin crystal.