Nanotechnology -- Measurement of defect concentration of graphene -- Raman spectroscopy method

Nanotechnology -- Measurement of defect concentration of graphene -- Raman spectroscopy method

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Standard Number GB/T 43341-2023
Organization Standardization Administration of China China
Level National
Category Test Method | Characterization | Measurement
Status
  • NOV 2023 Published
ABSTRACT

This document describes the method of measuring graphene defect concentration using Raman spectroscopy, including principles, instrument parameter requirements, sample preparation, and test testing steps and data analysis and processing:
This document is applicable to the point defect concentration measurement of single-layer graphene with a lateral size of not less than 2 μm, uniform physical properties, and clean surface.