Nanotechnology - Determination of the uniformity of SERS solid substrate - Raman mapping analysis

Nanotechnology - Determination of the uniformity of SERS solid substrate - Raman mapping analysis

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Standard Number GB/T 44075-2024
Organization Standardization Administration of China China
Level National
Category Test Method | Characterization | Measurement
Status
  • MAY 2024 Published
ABSTRACT

This document describes a method for measuring the uniformity of surface enhanced Raman solid-state substrates using Raman spectroscopy imaging analysis, including a method overview, Instruments and equipment, reagents and materials, test process and test reports, etc. This document is applicable to the uniformity measurement of SERS solid substrates.