A new method in spectromicroscopy significantly improves the study of chemical reactions at the nanoscale, both on surfaces and inside layered materials. Scanning X-ray microscopy (SXM) at MAXYMUS beamline of BESSY II enables the investigation of chemical species adsorbed on the top layer (surface) or intercalated within the MXene electrode (bulk) with high chemical sensitivity. The method was developed by a HZB team led by Dr. Tristan Petit. The scientists demonstrated among others first SXM on MXene flakes, a material used as electrode in lithium-ion batteries.
