Developing new techniques to improve atomic force microscopy

Date26th, Jun 2020

Summary:

Researchers from the University of Illinois at Urbana-Champaign have developed a new method to improve the noise associated with nanoscale chemical imaging using atomic force microscopy. The improvements will increase the versatility and the precision of the instrument.

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Research Graphic

image: Chemical signal produced by a 4 nm thick polymer film collected using previous deflection AFM-IR detection, top, compared to the new null-deflection approach. view more 

Credit: Image courtesy the Beckman Institute for Advanced Science and Technology

Researchers at the

Source:

EurekAlert