Working hard to get outstanding results for your next publication? PinPoint your Breakthrough via AFM - Webinar Series February - April 2021 From energy conversion, via nano-electronics and flexible electronics, to soft matter studies, we will address recent challenges of material investigations in nanoscience.
PinPoint your Breakthrough via AFM - Webinar Series February - April 2021
Current challenges in semiconductor, energy conversion and soft matter research require a nanoscale view into functional material properties and morphology best realized with atomic force microscopy (AFM). With this webinar series, we want to support you in achieving breakthrough AFM data for your material research with high precision and accuracy. From energy conversion to nano-electronics and flexible electronics, to soft matter studies, we will address recent challenges of material investigations in nanoscience.
Therefore, we will show you how to combine PinPoint AFM for nanomechanical imaging with functional electrical AFM modes like piezoelectric force microscopy (PFM), conductive AFM (C-AFM) and scanning spreading resistance microscopy (SSRM) to allow for more accurate and less invasive electromechanical and electrical imaging at the nanoscale.
Join the webinar journey here: www.parksystems.com/breakthroughviaAFM
