Location | USA - San Jose, CA |
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Start Date | Feb 21, 2016 |
End Date | Feb 25, 2016 |
Present and publish at SPIE Advanced Lithography 2016, the world's premier semiconductor lithorgraphy event. For over 40 years, SPIE has brought together industry leaders to solve the latest challenges in lithography and patterning in the semiconductor industry.
Main topics:
• Extreme Ultraviolet (EUV) Lithography
• Alternative Lithographic Technologies
• Metrology, Inspection, and Process Control for Microlithography
• Advances in Patterning Materials and Processes
• Optical Microlithography
• Design-Process-Technology Co-optimization for Manufacturability
• Advanced Etch Technology for Nanopatterning