Standard Number | ASTM E3220-20 |
---|---|
Organization | American Society for Testing and Materials |
Level | National |
Category | Guide | Practice |
Status |
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This standard will provide guidance on the measurement approaches for assessment of lateral flake size, average flake thickness, Raman intensity ratio of the D to G bands, and carbon/oxygen ratio for graphene and related products. The techniques included here are atomic force microscopy, Raman spectroscopy and X-ray photoelectron spectroscopy. Examples will be given for each type of measurement.