Semiconductor devices - Micro-electromechanical devices. Part 47: Silicon based MEMS fabrication technology - Measurement method of bending strength of microstructures

Semiconductor devices - Micro-electromechanical devices. Part 47: Silicon based MEMS fabrication technology - Measurement method of bending strength of microstructures

Standard Number BS EN IEC 62047-47
Organization British Standards Institution UK
Level National
Category Test Method | Characterization | Measurement
Status
  • SEP 2024 Under Development