Nanomanufacturing - Key control characteristics. Part 12-01: 2D material-related products - Density of interface traps: I-V curve analysis of field effect transistors

Nanomanufacturing - Key control characteristics. Part 12-01: 2D material-related products - Density of interface traps: I-V curve analysis of field effect transistors

Standard Number PD IEC/TS 62607-12-01
Organization British Standards Institution UK
Level National
Category Test Method | Characterization | Measurement
Status
  • JUN 2026 Under Development