Method of thickness measurement for thin crystal by convergent beam electron diffraction

Method of thickness measurement for thin crystal by convergent beam electron diffraction

Standard Number GB/T 20724-2006
Organization Standardization Administration of China China
Level National
Category Test Method | Characterization | Measurement
Status
  • DEC 2006 Published
ABSTRACT
This standard specifies the determination by transmission electron microscopy thin crystal thickness convergent beam electron diffraction method. This method is applicable to the measurement line indicates the 10 ^ ^ 9m ~ 0. 1 � 10 ^ ^ 3m, the thickness of the range of tens to hundreds of nanometers thickness of the thin crystal.